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Related Website:
http://www.nanotechweb.org/articles/news/2/3/13/1
Research Abstract:
Two silicon nanoparticles with approximately 70-nm radii imaged by transmission electron microscopy (TEM) by Chris Perrey in Professor Barry Carters research group at the University of Minnesota. Similar particles and much smaller were evaluated mechanically by graduate student Bill Mook in Professor William Gerberichs group. The nanosphere on the left is relatively defect free while the one at the right has a 
Additional Particle Information
Superhard Silicon Nanospheres (with W.M. Mook, C.R. Perrey, C.B. Carter, M.I. Baskes, R. Mukherjee, A. Gidwani, J. Heberlein, P.H. McMurry, and S.S. Girshick), J. Mech. Phys. Solids 51, 979 (2003).
Related Publications:
Transmission Electron Microscopy; A Textbook for Materials Science (with Dave Williams), Kluwer, New York (1996). Interfacial Engineering for Optimized Properties II (Ed. With Ernie Hall, Steve Nutt and Clyde Briant), Volume 586 of the MRS Symposium Proceedings (2000). EBSP of Ceramics Materials (with Jeff Farrer and Joe Michael) in Electron Backscatter Diffraction in Materials Science, Eds Adam Schwartz, Mukel Kumar and Brent Adams (Plenum, New York) (2000). Structure-Property Relationships 
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